Skip to main navigation Skip to search Skip to main content

Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling

  • Qiulin Yu*
  • , Chinmay Nawghane
  • , Zihan Zhang
  • , Bart Vandevelde
  • , Karl Fendt
  • , Thomas Krivec
  • , Dieter P. Gruber
  • *Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

52 Downloads (Pure)

Abstract

In this study, Machine Learning (ML) methods combined with Optuna hyperparameter optimization were investigated to predict creep strain in solder joints of multilayer chip capacitors. Material properties, geometry and thermal loading conditions were varied in simulations using Finite Element Modeling. Evaluated ML models included Random Forest, Gradient Boosting, Support Vector Regression (SVR) and Artificial Neural Network (ANN). The results demonstrated a prediction accuracy of 96%, particularly for SVR and ANN. The model performance significantly improved with increasing data size up to around 600 simulations. In the feature and hyperparameter importance analysis, solder stand-off height and component length most influenced ANN predictions, with learning rate being the key hyperparameter, while for SVR, the regularization parameter or kernel function was most critical.

Original languageEnglish
Article number115900
Number of pages11
JournalMicroelectronics Reliability
Volume174
DOIs
Publication statusPublished - 2025

Keywords

  • Machine learning
  • Microelectronics
  • Regression analysis
  • Solder joint
  • Surrogate modeling
  • Thermal cycling

Fingerprint

Dive into the research topics of 'Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling'. Together they form a unique fingerprint.

Cite this