Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.

B Guttler, OY Gorbenko, MA Samoilenkov, VA Amelichev, G Wahl, HW Zandbergen

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1179-1186
Number of pages	8
Journal	The European Physical Journal. Special Topics
Volume	9
Publication status	Published - 1999

Cite this

@article{26865d1237234013bab0e2099b0d6e07,

title = "Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.",

author = "B Guttler and OY Gorbenko and MA Samoilenkov and VA Amelichev and G Wahl and HW Zandbergen",

year = "1999",

language = "Undefined/Unknown",

volume = "9",

pages = "1179--1186",

journal = "The European Physical Journal. Special Topics",

issn = "1155-4339",

publisher = "EDP Sciences",

}

TY - JOUR

T1 - Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.

AU - Guttler, B

AU - Gorbenko, OY

AU - Samoilenkov, MA

AU - Amelichev, VA

AU - Wahl, G

AU - Zandbergen, HW

PY - 1999

Y1 - 1999

M3 - Article

SN - 1155-4339

VL - 9

SP - 1179

EP - 1186

JO - The European Physical Journal. Special Topics

JF - The European Physical Journal. Special Topics

ER -