Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.

B Guttler, OY Gorbenko, MA Samoilenkov, VA Amelichev, G Wahl, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageUndefined/Unknown
    Pages (from-to)1179-1186
    Number of pages8
    JournalThe European Physical Journal. Special Topics
    Publication statusPublished - 1999

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