Original language | Undefined/Unknown |
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Pages (from-to) | 1179-1186 |
Number of pages | 8 |
Journal | The European Physical Journal. Special Topics |
Volume | 9 |
Publication status | Published - 1999 |
Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.
B Guttler, OY Gorbenko, MA Samoilenkov, VA Amelichev, G Wahl, HW Zandbergen
Research output: Contribution to journal › Article › Scientific › peer-review