Application of the dual-beam FIB/SEM to metals research

VGM Sivel, J van den Brand, WR Wang, H Mohdadi, FD Tichelaar, PFA Alkemade, HW Zandbergen

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{4bb496f0684c4d52b6725f90118ffa24,

title = "Application of the dual-beam FIB/SEM to metals research",

keywords = "academic journal papers, ZX CWTS 1.00 <= JFIS < 3.00",

author = "VGM Sivel and {van den Brand}, J and WR Wang and H Mohdadi and FD Tichelaar and PFA Alkemade and HW Zandbergen",

year = "2004",

language = "Undefined/Unknown",

volume = "214",

pages = "237--245",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Blackwell",

number = "part 3",

}

TY - JOUR

T1 - Application of the dual-beam FIB/SEM to metals research

AU - Sivel, VGM

AU - van den Brand, J

AU - Wang, WR

AU - Mohdadi, H

AU - Tichelaar, FD

AU - Alkemade, PFA

AU - Zandbergen, HW

PY - 2004

Y1 - 2004

KW - academic journal papers

KW - ZX CWTS 1.00 <= JFIS < 3.00

M3 - Article

SN - 0022-2720

VL - 214

SP - 237

EP - 245

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - part 3

ER -