Application of the dual-beam FIB/SEM to metals research

VGM Sivel, J van den Brand, WR Wang, H Mohdadi, FD Tichelaar, PFA Alkemade, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    43 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)237-245
    Number of pages9
    JournalJournal of Microscopy
    Volume214
    Issue numberpart 3
    Publication statusPublished - 2004

    Keywords

    • academic journal papers
    • ZX CWTS 1.00 <= JFIS < 3.00

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