Application of x-ray computed tomography in silicon solar cells

V Popovich, W Verwaal, M Janssen, IJ Bennett, IM Richardson

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    7 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings 35th IEEE Photovoltaic Specialists Conference (PVSC), June 20-25, 2010, Honolulu, Hawaii
    EditorsJD Meakin
    PublisherIEEE Society
    Number of pages6
    ISBN (Print)978-1-4244-5890-5
    Publication statusPublished - 2010
    EventPVSC 2010: 35th IEEE Photovoltaic Specialists Conference - Honolulu, HI, United States
    Duration: 20 Jun 201025 Jun 2010
    Conference number: 35


    ConferencePVSC 2010
    Abbreviated titlePVSC
    Country/TerritoryUnited States
    CityHonolulu, HI

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