Approximating infinite dynamic behavior for DRAM cell defects

Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

26 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	20th VLSI Test symposium Proceedings
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	401-407
Number of pages	7
ISBN (Print)	0-7695-1570-3
Publication status	Published - 2002
Event	20th IEEE VLSI Test symposium - Piscataway, NJ, USA Duration: 28 Apr 2002 → 2 May 2002

Name
Publisher	IEEE

Conference	20th IEEE VLSI Test symposium
Period	28/04/02 → 2/05/02

Keywords

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KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-1570-3

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EP - 407

BT - 20th VLSI Test symposium Proceedings

PB - IEEE Society

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T2 - 20th IEEE VLSI Test symposium

Y2 - 28 April 2002 through 2 May 2002

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