Asphalt material characterization with (nano) x-ray computerized tomography

MFC van de Ven, W Verwaal, AAA Molenaar

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationAdvances and Trends in Engineering Materials and their Applications, Montreal, Canada
EditorsYM Haddad
Place of PublicationOttawa, Canada
PublisherAdvanced engineering solutions
Pages267-272
Number of pages6
ISBN (Print)978-0-9780479-2-4
Publication statusPublished - 2009
EventAES-ATEMA' 2009 Third International Conference on Advances and Trends in Engineering Materials and their Applications, Montreal, Canada - Ottawa, Canada
Duration: 6 Jul 200910 Jul 2009

Publication series

Name
PublisherAdvanced Engineering Solutions

Conference

ConferenceAES-ATEMA' 2009 Third International Conference on Advances and Trends in Engineering Materials and their Applications, Montreal, Canada
Period6/07/0910/07/09

Keywords

  • Conf.proc. > 3 pag

Cite this

van de Ven, MFC., Verwaal, W., & Molenaar, AAA. (2009). Asphalt material characterization with (nano) x-ray computerized tomography. In YM. Haddad (Ed.), Advances and Trends in Engineering Materials and their Applications, Montreal, Canada (pp. 267-272). Advanced engineering solutions.