TY - JOUR
T1 - Asymmetric kernel in Gaussian Processes for learning target variance
AU - Pintea, S.L.
AU - van Gemert, J.C.
AU - Smeulders, A.W.M.
PY - 2018
Y1 - 2018
N2 - This work incorporates the multi-modality of the data distribution into a Gaussian Process regression model. We approach the problem from a discriminative perspective by learning, jointly over the training data, the target space variance in the neighborhood of a certain sample through metric learning. We start by using data centers rather than all training samples. Subsequently, each center selects an individualized kernel metric. This enables each center to adjust the kernel space in its vicinity in correspondence with the topology of the targets — a multi-modal approach. We additionally add descriptiveness by allowing each center to learn a precision matrix. We demonstrate empirically the reliability of the model.
AB - This work incorporates the multi-modality of the data distribution into a Gaussian Process regression model. We approach the problem from a discriminative perspective by learning, jointly over the training data, the target space variance in the neighborhood of a certain sample through metric learning. We start by using data centers rather than all training samples. Subsequently, each center selects an individualized kernel metric. This enables each center to adjust the kernel space in its vicinity in correspondence with the topology of the targets — a multi-modal approach. We additionally add descriptiveness by allowing each center to learn a precision matrix. We demonstrate empirically the reliability of the model.
KW - Asymmetric kernel distances
KW - Gaussian process
KW - Kernel metric learning
KW - Regression
UR - http://www.scopus.com/inward/record.url?scp=85043790128&partnerID=8YFLogxK
U2 - 10.1016/j.patrec.2018.02.026
DO - 10.1016/j.patrec.2018.02.026
M3 - Article
AN - SCOPUS:85043790128
VL - 108
SP - 70
EP - 77
JO - Pattern Recognition Letters
JF - Pattern Recognition Letters
SN - 0167-8655
ER -