Atomic-resolution electron microscopy at ambient pressure

JF Creemer, S Helveg, AM Molenbroek, PM Sarro, HW Zandbergen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publication14th european microscopy congress
EditorsS Richter, A Schwedt
Place of PublicationAachem, Germany
PublisherSpringer
Pages197-198
Number of pages2
ISBN (Print)978-3-540-85225-4
Publication statusPublished - 2008
EventEMC 2008, Aachem, Germany - Aachem, Germany
Duration: 1 Sep 20085 Sep 2008

Publication series

Name
PublisherSpringer Berlin Heidelberg
Name
Volume2

Conference

ConferenceEMC 2008, Aachem, Germany
Period1/09/085/09/08

Keywords

  • conference contrib. refereed
  • Geen BTA classificatie

Cite this

Creemer, JF., Helveg, S., Molenbroek, AM., Sarro, PM., & Zandbergen, HW. (2008). Atomic-resolution electron microscopy at ambient pressure. In S. Richter, & A. Schwedt (Eds.), 14th european microscopy congress (pp. 197-198). Springer.