Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment

J Kokorian; U Staufer; WM van Spengen

doi:10.1109/TRANSDUCERS.2015.7181037

Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment

J Kokorian, U Staufer, WM van Spengen

Micro and Nano Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015
Editors	G Fedder, VM Bright, TW Kenny
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	772-775
Number of pages	4
ISBN (Print)	978-1-4799-8955-3
DOIs	https://doi.org/10.1109/TRANSDUCERS.2015.7181037
Publication status	Published - 2015
Event	Transducers 2015, Anchorage, Alaska, USA - Piscataway, NJ, USA Duration: 21 Jun 2015 → 25 Jun 2015

Publication series

Name
Publisher	IEEE

Conference

Conference	Transducers 2015, Anchorage, Alaska, USA
Period	21/06/15 → 25/06/15

Bibliographical note

Harvest

Access to Document

10.1109/TRANSDUCERS.2015.7181037

Cite this

Kokorian, J., Staufer, U., & van Spengen, WM. (2015). Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment. In G. Fedder, VM. Bright, & TW. Kenny (Eds.), Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015 (pp. 772-775). IEEE Society. https://doi.org/10.1109/TRANSDUCERS.2015.7181037

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title = "Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment",

author = "J Kokorian and U Staufer and {van Spengen}, WM",

note = "Harvest; Transducers 2015, Anchorage, Alaska, USA ; Conference date: 21-06-2015 Through 25-06-2015",

year = "2015",

doi = "10.1109/TRANSDUCERS.2015.7181037",

language = "English",

isbn = "978-1-4799-8955-3",

publisher = "IEEE Society",

pages = "772--775",

editor = "G Fedder and VM Bright and TW Kenny",

booktitle = "Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015",

}

Kokorian, J, Staufer, U & van Spengen, WM 2015, Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment. in G Fedder, VM Bright & TW Kenny (eds), Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015. IEEE Society, Piscataway, NJ, USA, pp. 772-775, Transducers 2015, Anchorage, Alaska, USA, 21/06/15. https://doi.org/10.1109/TRANSDUCERS.2015.7181037

Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment. / Kokorian, J; Staufer, U; van Spengen, WM.
Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015. ed. / G Fedder; VM Bright; TW Kenny. Piscataway, NJ, USA: IEEE Society, 2015. p. 772-775.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment

AU - Kokorian, J

AU - Staufer, U

AU - van Spengen, WM

N1 - Harvest

PY - 2015

Y1 - 2015

U2 - 10.1109/TRANSDUCERS.2015.7181037

DO - 10.1109/TRANSDUCERS.2015.7181037

M3 - Conference contribution

SN - 978-1-4799-8955-3

SP - 772

EP - 775

BT - Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015

A2 - Fedder, G

A2 - Bright, VM

A2 - Kenny, TW

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - Transducers 2015, Anchorage, Alaska, USA

Y2 - 21 June 2015 through 25 June 2015

ER -

Kokorian J, Staufer U, van Spengen WM. Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment. In Fedder G, Bright VM, Kenny TW, editors, Proceedings of the 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) 2015. Piscataway, NJ, USA: IEEE Society. 2015. p. 772-775 doi: 10.1109/TRANSDUCERS.2015.7181037