| Original language | English |
|---|---|
| Pages (from-to) | 1-6 |
| Number of pages | 6 |
| Journal | Scientific Reports |
| Volume | 3 |
| DOIs | |
| Publication status | Published - 2013 |
Atomic scale verification of oxide-ion vacancy distribution near a single grain boundary in YSZ
J An, J Sun Park, A Leen Koh, HB Lee, H Joon Jung, J Schoonman, R Sinclair, TM Gur, FB Prinz
Research output: Contribution to journal › Article › Scientific › peer-review
70
Citations
(SciVal)