Automated adjustment of aberration correction in scanning confocal microscopy

HW Yoo, M Verhaegen, ME Royen, G Schitter

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 2012 IEEE International Instrumentation and Measurement Technology Conference
EditorsG Brasseur, M Gard
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1083-1088
Number of pages6
ISBN (Print)978-1-4577-1773-4
DOIs
Publication statusPublished - 2012
EventI2MTC, Graz, Austria - Piscataway, NJ, USA
Duration: 13 May 201216 May 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceI2MTC, Graz, Austria
Period13/05/1216/05/12

Keywords

  • Conf.proc. > 3 pag

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