Automated adjustment of aberration correction in scanning confocal microscopy

HW Yoo; M Verhaegen; ME Royen; G Schitter

doi:10.1109/I2MTC.2012.6229195

Automated adjustment of aberration correction in scanning confocal microscopy

HW Yoo, M Verhaegen, ME Royen, G Schitter

Team Michel Verhaegen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	English
Title of host publication	Proceedings 2012 IEEE International Instrumentation and Measurement Technology Conference
Editors	G Brasseur, M Gard
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1083-1088
Number of pages	6
ISBN (Print)	978-1-4577-1773-4
DOIs	https://doi.org/10.1109/I2MTC.2012.6229195
Publication status	Published - 2012
Event	I2MTC, Graz, Austria - Piscataway, NJ, USA Duration: 13 May 2012 → 16 May 2012

Publication series

Name
Publisher	IEEE

Conference

Conference	I2MTC, Graz, Austria
Period	13/05/12 → 16/05/12

Bibliographical note

harvest

Keywords

Conf.proc. > 3 pag

Access to Document

10.1109/I2MTC.2012.6229195

Cite this

@inproceedings{bda5e39fe31c4380bd280e0f15e824b4,

title = "Automated adjustment of aberration correction in scanning confocal microscopy",

keywords = "Conf.proc. > 3 pag",

author = "HW Yoo and M Verhaegen and ME Royen and G Schitter",

note = "harvest; I2MTC, Graz, Austria ; Conference date: 13-05-2012 Through 16-05-2012",

year = "2012",

doi = "10.1109/I2MTC.2012.6229195",

language = "English",

isbn = "978-1-4577-1773-4",

publisher = "IEEE Society",

pages = "1083--1088",

editor = "G Brasseur and M Gard",

booktitle = "Proceedings 2012 IEEE International Instrumentation and Measurement Technology Conference",

}

Yoo, HW, Verhaegen, M, Royen, ME & Schitter, G 2012, Automated adjustment of aberration correction in scanning confocal microscopy. in G Brasseur & M Gard (eds), Proceedings 2012 IEEE International Instrumentation and Measurement Technology Conference. IEEE Society, Piscataway, NJ, USA, pp. 1083-1088, I2MTC, Graz, Austria, 13/05/12. https://doi.org/10.1109/I2MTC.2012.6229195

Automated adjustment of aberration correction in scanning confocal microscopy. / Yoo, HW; Verhaegen, M; Royen, ME et al.
Proceedings 2012 IEEE International Instrumentation and Measurement Technology Conference. ed. / G Brasseur; M Gard. Piscataway, NJ, USA: IEEE Society, 2012. p. 1083-1088.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Automated adjustment of aberration correction in scanning confocal microscopy

AU - Yoo, HW

AU - Verhaegen, M

AU - Royen, ME

AU - Schitter, G

N1 - harvest

PY - 2012

Y1 - 2012

KW - Conf.proc. > 3 pag

U2 - 10.1109/I2MTC.2012.6229195

DO - 10.1109/I2MTC.2012.6229195

M3 - Conference contribution

SN - 978-1-4577-1773-4

SP - 1083

EP - 1088

BT - Proceedings 2012 IEEE International Instrumentation and Measurement Technology Conference

A2 - Brasseur, G

A2 - Gard, M

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - I2MTC, Graz, Austria

Y2 - 13 May 2012 through 16 May 2012

ER -