Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers

C Papameletis, B Keller, V Chickermane, EJ Marinissen, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

12 Citations (Scopus)
Original languageEnglish
Title of host publication18th IEEE European Test Symposium
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)978-1-4673-6377-8
Publication statusPublished - 2013
EventETS 2013 - Piscataway
Duration: 27 May 201331 May 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceETS 2013
Period27/05/1331/05/13

Cite this

Papameletis, C., Keller, B., Chickermane, V., Marinissen, EJ., & Hamdioui, S. (2013). Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. In s.n. (Ed.), 18th IEEE European Test Symposium (pp. 1-6). IEEE Society.