Automated Fault Diagnosis in Embedded Systems

P Zoeteweij, J Pietersma, RF Abreu, AB Feldman, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

12 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.
Editors s.n.
Place of PublicationLos Alamitos, USA
PublisherIEEE
Pages103-110
Number of pages8
Publication statusPublished - 2008
EventSSIRI 2008 - Los Alamitos, USA
Duration: 14 Jul 200817 Jul 2008

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceSSIRI 2008
Period14/07/0817/07/08

Keywords

  • Conf.proc. > 3 pag

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