Automatic Basis Function Selection in Iterative Learning Control: A Sparsity-Promoting Approach Applied to an Industrial Printer

Tjeerd Ickenroth*, Max Van Haren, Johan Kon, Max Van Meer, Jilles Van Hulst, Tom Oomen

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

Iterative learning control (ILC) techniques are capable of improving the tracking performance of control systems that repeatedly perform similar tasks by utilizing data from past iterations. The aim of this paper is to design a systematic approach for learning parameterized feedforward signals with limited complexity. The developed method involves an iterative learning control in conjunction with a data-driven sparse subset selection procedure for basis function selection. The ILC algorithm that employs sparse optimization is able to automatically select relevant basis functions and is validated on an industrial flatbed printer.

Original languageEnglish
Title of host publicationProceedings of the 2025 American Control Conference, ACC 2025
PublisherIEEE
Pages2931-2936
Number of pages6
ISBN (Electronic)979-8-3315-6937-2
DOIs
Publication statusPublished - 2025
Event2025 American Control Conference, ACC 2025 - Denver, United States
Duration: 8 Jul 202510 Jul 2025

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Conference

Conference2025 American Control Conference, ACC 2025
Country/TerritoryUnited States
CityDenver
Period8/07/2510/07/25

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/publishing/publisher-deals
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

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