Avalanche Ruggedness Evaluation on Planar and Trench SiC MOSFETs: An Experimental and TCAD Simulation Study
- Tao Luo
- , Runding Luo
- , Zaiman Xiang
- , Jianjun Zhuang
- , Guoqi Zhang
- , Jiajie Fan*
*Corresponding author for this work
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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