Bandwidth analyses for reusing functional interconnect as test access mechanism

A van den Berg, R Ren, E Marinissen, GN Gaydadjiev, KGW Goossens

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

8 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	13th European test Symposium
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	21-26
Number of pages	6
ISBN (Print)	978-0-7695-3150-2
Publication status	Published - 2008
Event	ETS 2008 - Piscataway Duration: 25 May 2008 → 29 May 2008

Name
Publisher	IEEE

Conference	ETS 2008
Period	25/05/08 → 29/05/08

Keywords

@inproceedings{1e570bca2a534cc3a11ea38801945b7d,

title = "Bandwidth analyses for reusing functional interconnect as test access mechanism",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{van den Berg}, A and R Ren and E Marinissen and GN Gaydadjiev and KGW Goossens",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-0-7695-3150-2",

publisher = "IEEE Society",

pages = "21--26",

editor = "s.n.",

booktitle = "13th European test Symposium",

note = "ETS 2008 ; Conference date: 25-05-2008 Through 29-05-2008",

}

TY - GEN

T1 - Bandwidth analyses for reusing functional interconnect as test access mechanism

AU - van den Berg, A

AU - Ren, R

AU - Marinissen, E

AU - Gaydadjiev, GN

AU - Goossens, KGW

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-0-7695-3150-2

SP - 21

EP - 26

BT - 13th European test Symposium

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

T2 - ETS 2008

Y2 - 25 May 2008 through 29 May 2008

ER -