Bandwidth analyses for reusing functional interconnect as test access mechanism

A van den Berg, R Ren, E Marinissen, GN Gaydadjiev, KGW Goossens

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

7 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publication13th European test Symposium
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages21-26
Number of pages6
ISBN (Print)978-0-7695-3150-2
Publication statusPublished - 2008
EventETS 2008 - Piscataway
Duration: 25 May 200829 May 2008

Publication series

Name
PublisherIEEE

Conference

ConferenceETS 2008
Period25/05/0829/05/08

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this