Base-band impedance control and calibration for on-wafer linearity measurements

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    12 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProceedings 63rd ARFTG conference
    Place of PublicationPiscataway
    PublisherIEEE
    Pages1-6
    Number of pages6
    Publication statusPublished - 2004
    Event63rd Automatic RF Techniques Group Conference, Fort Worth, USA - Piscataway
    Duration: 10 Jun 200411 Jun 2004

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference63rd Automatic RF Techniques Group Conference, Fort Worth, USA
    Period10/06/0411/06/04

    Bibliographical note

    ed. is niet bekend

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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