@inproceedings{63aeb63088f24942b403b17180240c90,
title = "Base-band impedance control and calibration for on-wafer linearity measurements",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "Pelk, {M J} and {de Vreede}, LCN and M Spirito and HFF Jos",
note = "ed. is niet bekend; 63rd Automatic RF Techniques Group Conference, Fort Worth, USA ; Conference date: 10-06-2004 Through 11-06-2004",
year = "2004",
language = "Undefined/Unknown",
publisher = "IEEE",
pages = "1--6",
booktitle = "Proceedings 63rd ARFTG conference",
address = "United States",
}