Bayesian accelerated life testing under competing failure models

C Bunea, TA Mazzuchi

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    11 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 2005 annual reliability and maintainance symposium
    Editors s.n.
    Place of PublicationPiscataway
    PublisherIEEE Society
    Pages152-157
    Number of pages6
    ISBN (Print)0-7803-8824-0
    Publication statusPublished - 2005
    EventThe 52nd Annual Reliability & Maintainability Symposium (RAMS), Newport Beach, USA - Piscataway
    Duration: 23 Jan 200526 Jan 2005

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceThe 52nd Annual Reliability & Maintainability Symposium (RAMS), Newport Beach, USA
    Period23/01/0526/01/05

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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