Benchmarking Gate Fidelities in a Si/SiGe Two-Qubit Device

X. Xue, T. F. Watson, J. Helsen, D. R. Ward, D. E. Savage, M. G. Lagally, S. N. Coppersmith, M. A. Eriksson, S. Wehner, L. M.K. Vandersypen*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

103 Citations (Scopus)
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