Benefit of microscopic diffusion measurement for the characterization of nanoporous materials

J Kärger; J. Caro; P Cool; MO Coppens; D Jones; F Kapteijn; F Rofriguez-Reinoso; M Stocker; D Theodorou; EF Vansant; J Weitkamp

Benefit of microscopic diffusion measurement for the characterization of nanoporous materials

J Kärger, J. Caro, P Cool, MO Coppens, D Jones, F Kapteijn, F Rofriguez-Reinoso, M Stocker, D Theodorou, EF Vansant, J Weitkamp

ChemE/Catalysis Engineering

Research output: Contribution to journal › Article › Scientific › peer-review

23 Citations (Scopus)

Original language	Undefined/Unknown
Pages (from-to)	1494-1511
Number of pages	18
Journal	Chemical Engineering and Technology
Volume	32
Issue number	10
Publication status	Published - 2009

Keywords

academic journal papers
CWTS JFIS < 0.75

Cite this

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title = "Benefit of microscopic diffusion measurement for the characterization of nanoporous materials",

keywords = "academic journal papers, CWTS JFIS < 0.75",

author = "J K{\"a}rger and J. Caro and P Cool and MO Coppens and D Jones and F Kapteijn and F Rofriguez-Reinoso and M Stocker and D Theodorou and EF Vansant and J Weitkamp",

year = "2009",

language = "Undefined/Unknown",

volume = "32",

pages = "1494--1511",

journal = "Chemical Engineering and Technology",

issn = "0930-7516",

publisher = "Wiley",

number = "10",

}

TY - JOUR

T1 - Benefit of microscopic diffusion measurement for the characterization of nanoporous materials

AU - Kärger, J

AU - Caro, J.

AU - Cool, P

AU - Coppens, MO

AU - Jones, D

AU - Kapteijn, F

AU - Rofriguez-Reinoso, F

AU - Stocker, M

AU - Theodorou, D

AU - Vansant, EF

AU - Weitkamp, J

PY - 2009

Y1 - 2009

KW - academic journal papers

KW - CWTS JFIS < 0.75

M3 - Article

SN - 0930-7516

VL - 32

SP - 1494

EP - 1511

JO - Chemical Engineering and Technology

JF - Chemical Engineering and Technology

IS - 10

ER -