Bias temperature instability analysis in SRAM decoder

MSK Seyab, S Hamdioui, H Kukner, P Raghavan, F Catthoor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 18th IEEE European Test Symposium
EditorsP Girard, Z Peng
Place of PublicationLos Alamitos, CA, USA
PublisherIEEE Society
Pages1-1
Number of pages1
ISBN (Print)978-1-4673-6377-8
Publication statusPublished - 2013
EventETS 2013 - Piscataway
Duration: 27 May 201331 May 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceETS 2013
Period27/05/1331/05/13

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