Bias temperature instability analysis in SRAM decoder

MSK Seyab; S Hamdioui; H Kukner; P Raghavan; F Catthoor

Bias temperature instability analysis in SRAM decoder

MSK Seyab, S Hamdioui, H Kukner, P Raghavan, F Catthoor

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings 18th IEEE European Test Symposium
Editors	P Girard, Z Peng
Place of Publication	Los Alamitos, CA, USA
Publisher	IEEE
Pages	1-1
Number of pages	1
ISBN (Print)	978-1-4673-6377-8
Publication status	Published - 2013
Event	ETS 2013 - Piscataway Duration: 27 May 2013 → 31 May 2013

Publication series

Name
Publisher	IEEE

Conference

Conference	ETS 2013
Period	27/05/13 → 31/05/13

Cite this

@inproceedings{39ea54dbcc9d4d57832b2cd4c025a7ce,

title = "Bias temperature instability analysis in SRAM decoder",

author = "MSK Seyab and S Hamdioui and H Kukner and P Raghavan and F Catthoor",

year = "2013",

language = "English",

isbn = "978-1-4673-6377-8",

publisher = "IEEE",

pages = "1--1",

editor = "P Girard and Z Peng",

booktitle = "Proceedings 18th IEEE European Test Symposium",

address = "United States",

note = "ETS 2013 ; Conference date: 27-05-2013 Through 31-05-2013",

}

TY - GEN

T1 - Bias temperature instability analysis in SRAM decoder

AU - Seyab, MSK

AU - Hamdioui, S

AU - Kukner, H

AU - Raghavan, P

AU - Catthoor, F

PY - 2013

Y1 - 2013

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6569381

M3 - Conference contribution

SN - 978-1-4673-6377-8

SP - 1

EP - 1

BT - Proceedings 18th IEEE European Test Symposium

A2 - Girard, P

A2 - Peng, Z

PB - IEEE

CY - Los Alamitos, CA, USA

T2 - ETS 2013

Y2 - 27 May 2013 through 31 May 2013

ER -

Bias temperature instability analysis in SRAM decoder

Publication series

Conference

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Cite this