Bias temperature instability analysis, monitoring and mitigation for nano-scaled circuits

MSK Seyab

Research output: ThesisDissertation (TU Delft)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Bertels, K.L.M., Supervisor
  • Hamdioui, S., Advisor
Award date17 Sep 2013
Print ISBNs978-94-6186-209-9
Publication statusPublished - 2013

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