Breakdown of fixed defects in SF6 under different voltage wave shapes

S Meijer, E Gulski, JJ Smit, AJLM Kanters

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    11 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProceedings of 2005 International Symposium on Electrical Insulating Materials (ISEIM 2005)
    EditorsT Okamoto
    Place of PublicationPiscataway
    PublisherIEEE Society
    Pages702-705
    Number of pages4
    ISBN (Print)4-88686-063-X
    Publication statusPublished - 2005
    Event2005 International Symposium on Electrical Insulating Materials (ISEIM 2005), Kitakyushu, Japan - Piscataway
    Duration: 5 Jun 20059 Jun 2005

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference2005 International Symposium on Electrical Insulating Materials (ISEIM 2005), Kitakyushu, Japan
    Period5/06/059/06/05

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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