Breakdown probability of SF6 due to voltage transients

S Meijer, PHF Morshuis, JJ Smit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    4 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publication2004 Annual report conference on electrical insulation and dielectric phenomena
    Editors s.n.
    Place of PublicationPiscataway
    PublisherIEEE Society
    Pages502-505
    Number of pages4
    ISBN (Print)0-7803-8584-5
    Publication statusPublished - 2004
    Event2004 Annual report conference on electrical insulation and dielectric phenomena, Boulder, COL. USA - Piscataway
    Duration: 17 Oct 200420 Oct 2004

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference2004 Annual report conference on electrical insulation and dielectric phenomena, Boulder, COL. USA
    Period17/10/0420/10/04

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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