Breakdown probability of SF6 due to voltage transients

S Meijer, PHF Morshuis, JJ Smit

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	2004 Annual report conference on electrical insulation and dielectric phenomena
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	502-505
Number of pages	4
ISBN (Print)	0-7803-8584-5
Publication status	Published - 2004
Event	2004 Annual report conference on electrical insulation and dielectric phenomena, Boulder, COL. USA - Piscataway Duration: 17 Oct 2004 → 20 Oct 2004

Name
Publisher	IEEE

Conference	2004 Annual report conference on electrical insulation and dielectric phenomena, Boulder, COL. USA
Period	17/10/04 → 20/10/04

ed. is niet bekend

Keywords

@inproceedings{41569374d2134328973a740face86ce3,

title = "Breakdown probability of SF6 due to voltage transients",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "S Meijer and PHF Morshuis and JJ Smit",

note = "ed. is niet bekend; null ; Conference date: 17-10-2004 Through 20-10-2004",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7803-8584-5",

publisher = "IEEE Society",

pages = "502--505",

editor = "s.n.",

booktitle = "2004 Annual report conference on electrical insulation and dielectric phenomena",

}

TY - GEN

T1 - Breakdown probability of SF6 due to voltage transients

AU - Meijer, S

AU - Morshuis, PHF

AU - Smit, JJ

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-8584-5

SP - 502

EP - 505

BT - 2004 Annual report conference on electrical insulation and dielectric phenomena

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

Y2 - 17 October 2004 through 20 October 2004

ER -