Brightness Limitations In Sources For Static & Ultra-Fast High Resolution Electron Microscopy

BJ Cook

    Research output: ThesisDissertation (TU Delft)

    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Delft University of Technology
    • Kruit, P., Supervisor
    • Hommelhof, P, Advisor, External person
    • Luiten, OJ, Advisor, External person
    • van Vliet, L.J., Advisor
    • Hagen, C.W., Advisor
    • Schwind, G, Advisor, External person
    Award date19 Nov 2013
    Print ISBNs978-94-6191-975-5
    Publication statusPublished - 2013

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