BTI Impacts on logical gates in nano-scale CMOS technology

MSK Seyab, S Hamdioui, H Kukner, F Catthoor, P Raghavan

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

38 Citations (Scopus)
Original languageEnglish
Title of host publication15th IEEE Symposium on design and diagnostics of electronic circuits and systems
Editors s.n.
Place of Publications.l.
PublisherIEEE Society
Pages1-6
Number of pages6
Publication statusPublished - 2012
EventDDECS 2012 - s.l.
Duration: 18 Apr 201220 Apr 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceDDECS 2012
Period18/04/1220/04/12

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