BTI Impacts on logical gates in nano-scale CMOS technology

MSK Seyab, S Hamdioui, H Kukner, F Catthoor, P Raghavan

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

42 Citations (Scopus)

Original language	English
Title of host publication	15th IEEE Symposium on design and diagnostics of electronic circuits and systems
Editors	s.n.
Place of Publication	s.l.
Publisher	IEEE
Pages	1-6
Number of pages	6
Publication status	Published - 2012
Event	DDECS 2012 - s.l. Duration: 18 Apr 2012 → 20 Apr 2012

Name
Publisher	IEEE

Conference	DDECS 2012
Period	18/04/12 → 20/04/12

Cite this

@inproceedings{89010473b76a4903a092844a029f80c2,

title = "BTI Impacts on logical gates in nano-scale CMOS technology",

author = "MSK Seyab and S Hamdioui and H Kukner and F Catthoor and P Raghavan",

year = "2012",

language = "English",

publisher = "IEEE",

pages = "1--6",

editor = "s.n.",

booktitle = "15th IEEE Symposium on design and diagnostics of electronic circuits and systems",

address = "United States",

note = "DDECS 2012 ; Conference date: 18-04-2012 Through 20-04-2012",

}

TY - GEN

T1 - BTI Impacts on logical gates in nano-scale CMOS technology

AU - Seyab, MSK

AU - Hamdioui, S

AU - Kukner, H

AU - Catthoor, F

AU - Raghavan, P

PY - 2012

Y1 - 2012

UR - http://ce-publications.et.tudelft.nl/publications/134_bti_impacts_on_logical_gates_in_nanoscale_cmos_technology.pdf

M3 - Conference contribution

SP - 1

EP - 6

BT - 15th IEEE Symposium on design and diagnostics of electronic circuits and systems

A2 - s.n., null

PB - IEEE

CY - s.l.

T2 - DDECS 2012

Y2 - 18 April 2012 through 20 April 2012

ER -