Buckling driven interface delamination between a thin metal layer and a ceramic substrate

CJ Liu; G.Q. Zhang; LJ Ernst; M Vervoort; G Wisse

Buckling driven interface delamination between a thin metal layer and a ceramic substrate

CJ Liu, G.Q. Zhang, LJ Ernst, M Vervoort, G Wisse

Dynamics of Micro and Nano Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	51st electronic components and technology conference, May 26 - June 1
Editors	P Slota Jr., WJ Howell
Place of Publication	s.l.
Publisher	IEEE
Pages	624-631
Number of pages	8
ISBN (Print)	0-7803-7038-4
Publication status	Published - 2001
Event	51st electronic components and tecjnology conference - s.l. Duration: 26 May 2001 → 1 Jun 2001

Publication series

Name
Publisher	IEEE

Conference

Conference	51st electronic components and tecjnology conference
Period	26/05/01 → 1/06/01

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{edb1a1124b15406c9b24c240ceb33799,

title = "Buckling driven interface delamination between a thin metal layer and a ceramic substrate",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "CJ Liu and G.Q. Zhang and LJ Ernst and M Vervoort and G Wisse",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-7803-7038-4",

publisher = "IEEE",

pages = "624--631",

editor = "{P Slota Jr.} and {WJ Howell}",

booktitle = "51st electronic components and technology conference, May 26 - June 1",

address = "United States",

note = "51st electronic components and tecjnology conference ; Conference date: 26-05-2001 Through 01-06-2001",

}

Buckling driven interface delamination between a thin metal layer and a ceramic substrate. / Liu, CJ; Zhang, G.Q.; Ernst, LJ et al.
51st electronic components and technology conference, May 26 - June 1. ed. / P Slota Jr.; WJ Howell. s.l.: IEEE, 2001. p. 624-631.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Buckling driven interface delamination between a thin metal layer and a ceramic substrate

AU - Liu, CJ

AU - Zhang, G.Q.

AU - Ernst, LJ

AU - Vervoort, M

AU - Wisse, G

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7038-4

SP - 624

EP - 631

BT - 51st electronic components and technology conference, May 26 - June 1

A2 - P Slota Jr., null

A2 - WJ Howell, null

PB - IEEE

CY - s.l.

T2 - 51st electronic components and tecjnology conference

Y2 - 26 May 2001 through 1 June 2001

ER -