C3CIM: Constant Column Current Memristor-Based Computation-in-Memory Micro-Architecture

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Abstract

Advancements in Artificial Intelligence (AI) and Internet-of-Things (IoT) have increased demand for edge AI, but deployment on traditional AI accelerators, like GPUs and TPUs, using von Neumann architecture, suffer from inefficiencies due to separate memory and compute units. Computation-in-Memory (CIM), utilizing non-volatile memristor devices to leverage analog computing principles and perform in-place computations, holds great potential in improving computational efficiency by eliminating frequent data movement. However, standard implementation of CIM faces several challenges, primarily high power consumption and subsequently induced nonlinearity, debating its viability for edge devices. In this paper, we propose C3CIM, a novel memristor-based CIM micro-architecture, featuring a new bit-cell and array design, targeting efficient implementation of Neural Networks (NN). Our architecture uses a constant current source to perform Multiply-and-Accumulate (MAC) operations with a very low computation current (10 to 100 nA), thereby significantly enhancing power efficiency. We adapted C3CIM for Spiking Neural Networks (SNN) and developed a prototype using TSMC 40nm CMOS node for on-silicon validation. Furthermore, our micro-architecture was benchmarked using two SNN models based on N-MNIST and IBM-Gesture datasets, for comparison against current state-of-the-art (SOTA). Results show up to 35x reduction in power along with 6.7x saving in energy compared to SOTA, demonstrating promising potential of this work for edge AI applications.

Original languageEnglish
Title of host publication2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings
PublisherIEEE
Number of pages7
ISBN (Electronic)9783982674100
DOIs
Publication statusPublished - 2025
Event2025 Design, Automation and Test in Europe Conference, DATE 2025 - Lyon, France
Duration: 31 Mar 20252 Apr 2025

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference2025 Design, Automation and Test in Europe Conference, DATE 2025
Country/TerritoryFrance
CityLyon
Period31/03/252/04/25

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

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