Exploiting PUF Variation to Detect Fault Injection Attacks

Troya  Köylü; Luiza Garaffa; Cezar Reinbrecht; Mahdi Zahedi; Said Hamdioui; Mottaqiallah Taouil

doi:10.1109/DDECS54261.2022.9770154

Exploiting PUF Variation to Detect Fault Injection Attacks

Troya Köylü^*, Luiza Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil^*

^*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

89 Downloads (Pure)

Abstract

The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we present a novel fault injection attack detector with high flexibility and low overhead. Our solution is based on the reuse of a security primitive used in many IoT devices, i.e., ring oscillator (RO) physically unclonable function (PUF). Our results show that we obtain a high detection effectiveness and no false alarms against most popular fault injection attacks based on voltage and clock manipulations.

Original language	English
Title of host publication	Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Editors	Hana Kubatova, Andreas Steininger, Maksim Jenihhin, Tomasz Garbolino, Petr Fiser, Jan Belohoubek, Jaroslav Borecky
Place of Publication	Danvers
Publisher	IEEE
Pages	74-79
Number of pages	6
ISBN (Electronic)	978-1-6654-9431-1
ISBN (Print)	978-1-6654-9432-8
DOIs	https://doi.org/10.1109/DDECS54261.2022.9770154
Publication status	Published - 2022
Event	2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Prague, Czech Republic Duration: 6 Apr 2022 → 8 Apr 2022 Conference number: 25th

Publication series

Name	Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022

Conference

Conference	2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Abbreviated title	DDECS 2022
Country/Territory	Czech Republic
City	Prague
Period	6/04/22 → 8/04/22

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

fault injection detection
PUF
RO
IoT
hardware security

Access to Document

10.1109/DDECS54261.2022.9770154

Exploiting_PUF_Variation_to_Detect_Fault_Injection_Attacks_1_Final published version, 0.98 MB

Cite this

Köylü, T., Garaffa, L., Reinbrecht, C., Zahedi, M., Hamdioui, S., & Taouil, M. (2022). Exploiting PUF Variation to Detect Fault Injection Attacks. In H. Kubatova, A. Steininger, M. Jenihhin, T. Garbolino, P. Fiser, J. Belohoubek, & J. Borecky (Eds.), Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (pp. 74-79). (Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022). IEEE. https://doi.org/10.1109/DDECS54261.2022.9770154

Köylü, Troya ; Garaffa, Luiza ; Reinbrecht, Cezar et al. / Exploiting PUF Variation to Detect Fault Injection Attacks. Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). editor / Hana Kubatova ; Andreas Steininger ; Maksim Jenihhin ; Tomasz Garbolino ; Petr Fiser ; Jan Belohoubek ; Jaroslav Borecky. Danvers : IEEE, 2022. pp. 74-79 (Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022).

@inproceedings{ca1b2094448b44a680f0b8825d6e4d21,

title = "Exploiting PUF Variation to Detect Fault Injection Attacks",

abstract = "The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we present a novel fault injection attack detector with high flexibility and low overhead. Our solution is based on the reuse of a security primitive used in many IoT devices, i.e., ring oscillator (RO) physically unclonable function (PUF). Our results show that we obtain a high detection effectiveness and no false alarms against most popular fault injection attacks based on voltage and clock manipulations.",

keywords = "fault injection detection, PUF, RO, IoT, hardware security",

author = "Troya K{\"o}yl{\"u} and Luiza Garaffa and Cezar Reinbrecht and Mahdi Zahedi and Said Hamdioui and Mottaqiallah Taouil",

note = "Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.; 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), DDECS 2022 ; Conference date: 06-04-2022 Through 08-04-2022",

year = "2022",

doi = "10.1109/DDECS54261.2022.9770154",

language = "English",

isbn = "978-1-6654-9432-8",

series = "Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022",

publisher = "IEEE",

pages = "74--79",

editor = "Hana Kubatova and Andreas Steininger and Maksim Jenihhin and Tomasz Garbolino and Petr Fiser and Jan Belohoubek and Jaroslav Borecky",

booktitle = "Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)",

address = "United States",

}

Köylü, T, Garaffa, L, Reinbrecht, C, Zahedi, M , Hamdioui, S & Taouil, M 2022, Exploiting PUF Variation to Detect Fault Injection Attacks. in H Kubatova, A Steininger, M Jenihhin, T Garbolino, P Fiser, J Belohoubek & J Borecky (eds), Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022, IEEE, Danvers, pp. 74-79, 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Prague, Czech Republic, 6/04/22. https://doi.org/10.1109/DDECS54261.2022.9770154

Exploiting PUF Variation to Detect Fault Injection Attacks. / Köylü, Troya ; Garaffa, Luiza; Reinbrecht, Cezar et al.
Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). ed. / Hana Kubatova; Andreas Steininger; Maksim Jenihhin; Tomasz Garbolino; Petr Fiser; Jan Belohoubek; Jaroslav Borecky. Danvers: IEEE, 2022. p. 74-79 (Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Exploiting PUF Variation to Detect Fault Injection Attacks

AU - Köylü, Troya

AU - Garaffa, Luiza

AU - Reinbrecht, Cezar

AU - Zahedi, Mahdi

AU - Hamdioui, Said

AU - Taouil, Mottaqiallah

N1 - Conference code: 25th

PY - 2022

Y1 - 2022

N2 - The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we present a novel fault injection attack detector with high flexibility and low overhead. Our solution is based on the reuse of a security primitive used in many IoT devices, i.e., ring oscillator (RO) physically unclonable function (PUF). Our results show that we obtain a high detection effectiveness and no false alarms against most popular fault injection attacks based on voltage and clock manipulations.

AB - The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we present a novel fault injection attack detector with high flexibility and low overhead. Our solution is based on the reuse of a security primitive used in many IoT devices, i.e., ring oscillator (RO) physically unclonable function (PUF). Our results show that we obtain a high detection effectiveness and no false alarms against most popular fault injection attacks based on voltage and clock manipulations.

KW - fault injection detection

KW - PUF

KW - RO

KW - IoT

KW - hardware security

UR - http://www.scopus.com/inward/record.url?scp=85130433632&partnerID=8YFLogxK

U2 - 10.1109/DDECS54261.2022.9770154

DO - 10.1109/DDECS54261.2022.9770154

M3 - Conference contribution

SN - 978-1-6654-9432-8

T3 - Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022

SP - 74

EP - 79

BT - Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

A2 - Kubatova, Hana

A2 - Steininger, Andreas

A2 - Jenihhin, Maksim

A2 - Garbolino, Tomasz

A2 - Fiser, Petr

A2 - Belohoubek, Jan

A2 - Borecky, Jaroslav

PB - IEEE

CY - Danvers

T2 - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

Y2 - 6 April 2022 through 8 April 2022

ER -

Köylü T, Garaffa L, Reinbrecht C, Zahedi M , Hamdioui S , Taouil M. Exploiting PUF Variation to Detect Fault Injection Attacks. In Kubatova H, Steininger A, Jenihhin M, Garbolino T, Fiser P, Belohoubek J, Borecky J, editors, Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Danvers: IEEE. 2022. p. 74-79. (Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022). doi: 10.1109/DDECS54261.2022.9770154

Exploiting PUF Variation to Detect Fault Injection Attacks

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

Other files and links

Fingerprint

Cite this