Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations.

J-D Kamminga, R Delhez

    Research output: Contribution to journalArticleScientificpeer-review

    25 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)1122-1127
    Number of pages6
    JournalJournal of Applied Crystallography
    Volume33
    Publication statusPublished - 2000

    Bibliographical note

    ISSN 0021-8898

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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