Calibrating lateral displacement sensitivity of AFM by stick-slip on stiff, amorphous surfaces

Liangyong Chu*, Marcel Bus, Alexander V. Korobko, Nicolaas A.M. Besseling

*Corresponding author for this work

    Research output: Contribution to journalArticleScientificpeer-review

    5 Citations (Scopus)
    9 Downloads (Pure)

    Abstract

    We calibrate the lateral mode AFM (LFM) by determining the position-sensitive photodetector (PSPD) signal dependency on the lateral tip displacement, which is analogous to the constant-compliance region in normal-force calibration. By stick-slip on stiff, amorphous surfaces (silica or glass), the lateral tip displacement is determined accurately using the feedback loop control of AFM system. The sufficiently high contact stiffness between the Si AFM tip and stiff, amorphous surfaces substantially reduces the error of PSPD signal dependency on the lateral tip displacement. No damage or modification of the AFM probe is involved and only a clean silicon or glass wafer is needed.

    Original languageEnglish
    Pages (from-to)1-4
    JournalUltramicroscopy
    Volume205
    DOIs
    Publication statusPublished - 2019

    Bibliographical note

    Accepted Author Manuscript

    Keywords

    • AFM
    • Calibration
    • Contact stiffness
    • Lateral force

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