Calibration and characterization techniques for on-wafer device characterization

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the 13th International New Circuits and Systems Conference, NEWCAS
EditorsD Morche, M Sawan
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)9781479988945
DOIs
Publication statusPublished - 2015
EventNEWCAS 2015, Grenoble, France - Piscataway
Duration: 7 Jun 201510 Jun 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceNEWCAS 2015, Grenoble, France
Period7/06/1510/06/15

Bibliographical note

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