@inproceedings{a0f11d2fb7ae4f9ab5e90e6183938de0,
title = "Calibration and characterization techniques for on-wafer device characterization",
author = "L Galatro and M Spirito",
note = "harvest; NEWCAS 2015, Grenoble, France ; Conference date: 07-06-2015 Through 10-06-2015",
year = "2015",
doi = "10.1109/NEWCAS.2015.7181978",
language = "English",
isbn = "9781479988945",
publisher = "IEEE Society",
pages = "1--4",
editor = "D Morche and M Sawan",
booktitle = "Proceedings of the 13th International New Circuits and Systems Conference, NEWCAS",
}