TY - JOUR
T1 - Canceling Fundamental Fractional Spurs Due to Self-Interference in a Digital Phase-Locked Loop
AU - Gao, Zhong
AU - Staszewski, Robert Bogdan
AU - Babaie, Masoud
PY - 2024
Y1 - 2024
N2 - Parasitic coupling between the building blocks within a fractional- N phase-locked loop (PLL) can result in noticeable spurs in its output spectrum, thus affecting the PLL’s usability in ultralow jitter applications. In this article, we focus on a chief contributor—“self-interference” caused by coupling from the PLL’s frequency-reference (FREF) clock buffer to the RF oscillator, while exploiting the fact that the resulting phase-disturbance pattern: 1) exhibits a sinusoidal shape and 2) is synchronized with the PLL’s output clock phase. Accordingly, we propose a digitally intensive pattern-aware approach to suppress the fundamental fractional spur raised by this self-interference mechanism. The proposed technique is applied to a fabricated digital PLL chip and reduces the worst spur level by 13 dB, thus proving its effectiveness.
AB - Parasitic coupling between the building blocks within a fractional- N phase-locked loop (PLL) can result in noticeable spurs in its output spectrum, thus affecting the PLL’s usability in ultralow jitter applications. In this article, we focus on a chief contributor—“self-interference” caused by coupling from the PLL’s frequency-reference (FREF) clock buffer to the RF oscillator, while exploiting the fact that the resulting phase-disturbance pattern: 1) exhibits a sinusoidal shape and 2) is synchronized with the PLL’s output clock phase. Accordingly, we propose a digitally intensive pattern-aware approach to suppress the fundamental fractional spur raised by this self-interference mechanism. The proposed technique is applied to a fabricated digital PLL chip and reduces the worst spur level by 13 dB, thus proving its effectiveness.
KW - Coupling
KW - fractional spurs
KW - phase-locked loop (PLL)
KW - self-interference
KW - spur cancellation (SC)
UR - http://www.scopus.com/inward/record.url?scp=85192730853&partnerID=8YFLogxK
U2 - 10.1109/JSSC.2024.3393478
DO - 10.1109/JSSC.2024.3393478
M3 - Article
AN - SCOPUS:85192730853
SN - 0018-9200
SP - 1
EP - 14
JO - IEEE Journal of Solid-State Circuits
JF - IEEE Journal of Solid-State Circuits
ER -