Capacitance sensitivity calculation for interconnects by adjoint field technique

Y Bi; NP van der Meijs; D. Ioan

doi:doi:10.1109/SPI.2008.4558365

Capacitance sensitivity calculation for interconnects by adjoint field technique

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 12th IEEE workshop on signal propagation on interconnects, SPI 2008
Editors	D Deschacht
Place of Publication	Avignon, France
Publisher	IEEE Society
Pages	1-4
Number of pages	4
ISBN (Print)	1-4244-2317-0
DOIs	https://doi.org/doi:10.1109/SPI.2008.4558365
Publication status	Published - 2008
Event	SPI 2008, Avignon, France - Avignon, France Duration: 12 May 2008 → 15 May 2008

Publication series

Name
Publisher	IEEE

Conference

Conference	SPI 2008, Avignon, France
Period	12/05/08 → 15/05/08

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

doi:10.1109/SPI.2008.4558365

Cite this

@inproceedings{b996f879900a4177bcc2044b88f02fb6,

title = "Capacitance sensitivity calculation for interconnects by adjoint field technique",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "Y Bi and {van der Meijs}, NP and D. Ioan",

year = "2008",

doi = "doi:10.1109/SPI.2008.4558365",

language = "Undefined/Unknown",

isbn = "1-4244-2317-0",

publisher = "IEEE Society",

pages = "1--4",

editor = "D Deschacht",

booktitle = "Proceedings of the 12th IEEE workshop on signal propagation on interconnects, SPI 2008",

note = "SPI 2008, Avignon, France ; Conference date: 12-05-2008 Through 15-05-2008",

}

Capacitance sensitivity calculation for interconnects by adjoint field technique. / Bi, Y; van der Meijs, NP; Ioan, D.
Proceedings of the 12th IEEE workshop on signal propagation on interconnects, SPI 2008. ed. / D Deschacht. Avignon, France: IEEE Society, 2008. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Capacitance sensitivity calculation for interconnects by adjoint field technique

AU - Bi, Y

AU - van der Meijs, NP

AU - Ioan, D.

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - doi:10.1109/SPI.2008.4558365

DO - doi:10.1109/SPI.2008.4558365

M3 - Conference contribution

SN - 1-4244-2317-0

SP - 1

EP - 4

BT - Proceedings of the 12th IEEE workshop on signal propagation on interconnects, SPI 2008

A2 - Deschacht, D

PB - IEEE Society

CY - Avignon, France

T2 - SPI 2008, Avignon, France

Y2 - 12 May 2008 through 15 May 2008

ER -