Causal modeling for integrated safety at airports

A.L.C. Roelen, R Wever, RM Cooke, HP Lopuhaa, M. Simons, P.J.L. Valk

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageUndefined/Unknown
Title of host publicationSafety and Reliability
EditorsTJ Bedford, PHAJM van Gelder
Place of PublicationLisse
PublisherSwets & Zeitlinger
Pages1321-1327
Number of pages7
ISBN (Print)90-5809-551-7
Publication statusPublished - 2003

Keywords

  • Wiskunde en Informatica
  • Techniek
  • technische Wiskunde en Informatica
  • Boekdeel internat.wet

Cite this

Roelen, A. L. C., Wever, R., Cooke, RM., Lopuhaa, HP., Simons, M., & Valk, P. J. L. (2003). Causal modeling for integrated safety at airports. In TJ. Bedford, & PHAJM. van Gelder (Eds.), Safety and Reliability (pp. 1321-1327). Swets & Zeitlinger.