Causal modeling for integrated safety at airports

A.L.C. Roelen, R Wever, RM Cooke, HP Lopuhaa, M. Simons, P.J.L. Valk

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageUndefined/Unknown
Title of host publicationSafety and Reliability
EditorsTJ Bedford, PHAJM van Gelder
Place of PublicationLisse
PublisherSwets & Zeitlinger
Number of pages7
ISBN (Print)90-5809-551-7
Publication statusPublished - 2003


  • Wiskunde en Informatica
  • Techniek
  • technische Wiskunde en Informatica
  • Boekdeel internat.wet

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