Characterisation of defects in porous silicon as an anode material using positron annihilation Doppler Broadening Spectroscopy

W. J. Legerstee*, T. Noort, T. K. van Vliet, H. Schut, E. M. Kelder

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

6 Downloads (Pure)

Abstract

Here we present Positron Annihilation Doppler Broadening Spectroscopy (PADBS) as a powerful method to analyse the origin and development of defect processes in porous silicon structures as a result of alloying with lithium for the use in battery anode applications. Several prepared anodes were lithiated (discharged against Li+/Li) and de-lithiated (charged) with different capacities followed by a distinct treatment procedure and an analysis using the Delft Variable Energy Positron Beam. The results presented here show that we can distinguish two different processes attributed to (1) structural changes in silicon as a result of the alloying process, and (2) the formation of defects that initiate degradation of the material. The limit at which the porous material can be used for at least the first two cycles without the occurrence of damage can thus be accurately determined by using the PADBS technique.

Original languageEnglish
Number of pages10
JournalApplied Nanoscience (Switzerland)
DOIs
Publication statusPublished - 2022

Keywords

  • Porous silicon
  • Positron annihilation
  • Silicon anode
  • Silicon lithium alloy

Fingerprint

Dive into the research topics of 'Characterisation of defects in porous silicon as an anode material using positron annihilation Doppler Broadening Spectroscopy'. Together they form a unique fingerprint.

Cite this