Characterization and modeling of multiple coupled inductors based on on-chip four-port measurement

K Kang, Z Zong, Z Gao, Y-L Ban, RB Staszewski, W-Y Yin

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)1696-1704
Number of pages9
JournalIEEE Transactions on Components, Packaging and Manufacturing Technology
Volume4
Issue number10
DOIs
Publication statusPublished - 2014

Keywords

  • academic journal papers
  • Peer-lijst tijdschrift

Cite this