Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.

S van Haver, OTA Janssen, JJM Braat, SF Pereira

Research output: Contribution to conferencePosterProfessional

Original languageUndefined/Unknown
Publication statusPublished - 2008
EventPoster presentatie NanonNed Symposium 2008 - Ede
Duration: 17 Nov 200819 Nov 2008

Other

OtherPoster presentatie NanonNed Symposium 2008
Period17/11/0819/11/08

Keywords

  • conference contrib. refereed
  • Geen BTA classificatie

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