Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.

S van Haver, OTA Janssen, JJM Braat, SF Pereira

Research output: Contribution to conference › Poster › Professional

Original language	Undefined/Unknown
Publication status	Published - 2008
Event	Poster presentatie NanonNed Symposium 2008 - Ede Duration: 17 Nov 2008 → 19 Nov 2008

Other	Poster presentatie NanonNed Symposium 2008
Period	17/11/08 → 19/11/08

TU DELFT

Keywords

@conference{19760ea091be4d2180f6394987459a6c,

title = "Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.",

keywords = "conference contrib. refereed, Geen BTA classificatie",

author = "{van Haver}, S and OTA Janssen and JJM Braat and SF Pereira",

note = "TU DELFT; Poster presentatie NanonNed Symposium 2008 ; Conference date: 17-11-2008 Through 19-11-2008",

year = "2008",

language = "Undefined/Unknown",

}

TY - CONF

T1 - Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.

AU - van Haver, S

AU - Janssen, OTA

AU - Braat, JJM

AU - Pereira, SF

N1 - TU DELFT

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Geen BTA classificatie

M3 - Poster

T2 - Poster presentatie NanonNed Symposium 2008

Y2 - 17 November 2008 through 19 November 2008

ER -