Characterization of a photonic strain sensor in silicon-on-insulator technology

WJ Westerveld; J Pozo; PJ Harmsma; R. Schmits; E Tabak; TC van den Dool; SM Leinders; KWA van Dongen; HP Urbach; M Yousefi

doi:10.1364/OL.37.000479

Characterization of a photonic strain sensor in silicon-on-insulator technology

WJ Westerveld, J Pozo, PJ Harmsma, R. Schmits, E Tabak, TC van den Dool, SM Leinders, KWA van Dongen, HP Urbach, M Yousefi

ImPhys/Optics

Research output: Contribution to journal › Article › Scientific › peer-review

25 Citations (Scopus)

Original language	English
Pages (from-to)	479-481
Number of pages	3
Journal	Optics Letters
Volume	37
Issue number	4
DOIs	https://doi.org/10.1364/OL.37.000479
Publication status	Published - 2012

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10.1364/OL.37.000479

Cite this

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title = "Characterization of a photonic strain sensor in silicon-on-insulator technology",

author = "WJ Westerveld and J Pozo and PJ Harmsma and R. Schmits and E Tabak and {van den Dool}, TC and SM Leinders and {van Dongen}, KWA and HP Urbach and M Yousefi",

year = "2012",

doi = "10.1364/OL.37.000479",

language = "English",

volume = "37",

pages = "479--481",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "The Optical Society",

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AU - Westerveld, WJ

AU - Pozo, J

AU - Harmsma, PJ

AU - Schmits, R.

AU - Tabak, E

AU - van den Dool, TC

AU - Leinders, SM

AU - van Dongen, KWA

AU - Urbach, HP

AU - Yousefi, M

PY - 2012

Y1 - 2012

U2 - 10.1364/OL.37.000479

DO - 10.1364/OL.37.000479

M3 - Article

SN - 0146-9592

VL - 37

SP - 479

EP - 481

JO - Optics Letters

JF - Optics Letters

IS - 4

ER -