Characterization of amorphous boron layers as diffusion barrier for pure aluminium

A Sakic; V Jovanovic; P Maleki; TLM Scholtes; S Milosavljevic; LK Nanver

Characterization of amorphous boron layers as diffusion barrier for pure aluminium

A Sakic, V Jovanovic, P Maleki, TLM Scholtes, S Milosavljevic, LK Nanver

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

15 Citations (Scopus)

Original language	English
Title of host publication	2010 Proceedings of the 33rd International Convention MIPRO
Editors	P Biljanovic et al
Place of Publication	Rijeka, Croatia
Publisher	MIPRO
Pages	26-29
Number of pages	4
ISBN (Print)	978-1-4244-7763-0
Publication status	Published - 2010
Event	33rd International Convention on Information and Communication Technology, Electronics and Microelectronics, Opatija, Croatia - Rijeka, Croatia Duration: 24 May 2010 → 28 May 2010

Publication series

Name
Publisher	MIPRO

Conference

Conference	33rd International Convention on Information and Communication Technology, Electronics and Microelectronics, Opatija, Croatia
Period	24/05/10 → 28/05/10

Keywords

Conf.proc. > 3 pag

Cite this

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title = "Characterization of amorphous boron layers as diffusion barrier for pure aluminium",

keywords = "Conf.proc. > 3 pag",

author = "A Sakic and V Jovanovic and P Maleki and TLM Scholtes and S Milosavljevic and LK Nanver",

year = "2010",

language = "English",

isbn = "978-1-4244-7763-0",

publisher = "MIPRO",

pages = "26--29",

editor = "{Biljanovic et al}, P",

booktitle = "2010 Proceedings of the 33rd International Convention MIPRO",

note = "33rd International Convention on Information and Communication Technology, Electronics and Microelectronics, Opatija, Croatia ; Conference date: 24-05-2010 Through 28-05-2010",

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Sakic, A, Jovanovic, V, Maleki, P, Scholtes, TLM , Milosavljevic, S & Nanver, LK 2010, Characterization of amorphous boron layers as diffusion barrier for pure aluminium. in P Biljanovic et al (ed.), 2010 Proceedings of the 33rd International Convention MIPRO. MIPRO, Rijeka, Croatia, pp. 26-29, 33rd International Convention on Information and Communication Technology, Electronics and Microelectronics, Opatija, Croatia, 24/05/10.

Characterization of amorphous boron layers as diffusion barrier for pure aluminium. / Sakic, A; Jovanovic, V; Maleki, P; Scholtes, TLM ; Milosavljevic, S; Nanver, LK.

2010 Proceedings of the 33rd International Convention MIPRO. ed. / P Biljanovic et al. Rijeka, Croatia : MIPRO, 2010. p. 26-29.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Characterization of amorphous boron layers as diffusion barrier for pure aluminium

AU - Sakic, A

AU - Jovanovic, V

AU - Maleki, P

AU - Scholtes, TLM

AU - Milosavljevic, S

AU - Nanver, LK

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5533699&tag=1

M3 - Conference contribution

SN - 978-1-4244-7763-0

SP - 26

EP - 29

BT - 2010 Proceedings of the 33rd International Convention MIPRO

A2 - Biljanovic et al, P

PB - MIPRO

CY - Rijeka, Croatia

T2 - 33rd International Convention on Information and Communication Technology, Electronics and Microelectronics, Opatija, Croatia

Y2 - 24 May 2010 through 28 May 2010

ER -

Characterization of amorphous boron layers as diffusion barrier for pure aluminium

Publication series

Conference

Keywords

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