Characterization of cast AlSi(Cu) alloys by scanning Kelvin probe force microscopy.

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Keywords

@article{d0a05da23faf483fa068c54ba20b4899,

title = "Characterization of cast AlSi(Cu) alloys by scanning Kelvin probe force microscopy.",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "EL Fratila-Apachitei and I Apachitei and J Duszczyk",

year = "2006",

language = "Undefined/Unknown",

volume = "36",

pages = "5892--5896",

journal = "Electrochimica Acta",

issn = "0013-4686",

publisher = "Elsevier",

}