Characterization of cast AlSi(Cu) alloys by scanning Kelvin probe force microscopy.

Research output: Contribution to journalArticleScientificpeer-review

30 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)5892-5896
Number of pages5
JournalElectrochimica Acta
Volume36
Publication statusPublished - 2006

Keywords

  • CWTS 0.75 <= JFIS < 2.00

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