Characterization of High Aspect-Ratio TiAu TES X-ray Microcalorimeter Array Under AC Bias

E. Taralli^*, L. Gottardi, K. Nagayoshi, M. Ridder, S. Visser, P. Khosropanah, H. Akamatsu, J. van der Kuur, M. Bruijn, J. R. Gao

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review