Characterization of integrated optical strain sensors based on silicon waveguides

WJ Westerveld; SM Leinders; PM Muilwijk; J Pozo; TC van den Dool; MD Verweij; M Yousefi; HP Urbach

doi:10.1109/JSTQE.2013.2289992

Characterization of integrated optical strain sensors based on silicon waveguides

WJ Westerveld, SM Leinders, PM Muilwijk, J Pozo, TC van den Dool, MD Verweij, M Yousefi, HP Urbach

ImPhys/Optics

Research output: Contribution to journal › Article › Scientific › peer-review

25 Citations (Scopus)

Original language	English
Pages (from-to)	1-10
Number of pages	10
Journal	IEEE Journal of Selected Topics in Quantum Electronics
Volume	20
Issue number	4
DOIs	https://doi.org/10.1109/JSTQE.2013.2289992
Publication status	Published - 2014

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CWTS 0.75 <= JFIS < 2.00

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10.1109/JSTQE.2013.2289992

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AU - Westerveld, WJ

AU - Leinders, SM

AU - Muilwijk, PM

AU - Pozo, J

AU - van den Dool, TC

AU - Verweij, MD

AU - Yousefi, M

AU - Urbach, HP

PY - 2014

Y1 - 2014

KW - CWTS 0.75 <= JFIS < 2.00

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DO - 10.1109/JSTQE.2013.2289992

M3 - Article

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VL - 20

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EP - 10

JO - IEEE Journal of Selected Topics in Quantum Electronics

JF - IEEE Journal of Selected Topics in Quantum Electronics

IS - 4

ER -

Characterization of integrated optical strain sensors based on silicon waveguides

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