Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

C Veerappan, J Richardson, R Walker, DU Li, MW Fishburn, D Stoppa, F Borgetti, Y Maruyama, MA Gersbach, RK Henderson, C Bruschini, E Charbon

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

16 Citations (Scopus)
Original languageEnglish
Title of host publicationProc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC)
EditorsR Woltjer
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages331-334
Number of pages4
ISBN (Print)978-1-4577-0705-6
DOIs
Publication statusPublished - 2011
EventEuropean Solid-State Electron Device Conference (ESSDERC 2011) - Piscataway, NJ, USA
Duration: 12 Sep 201116 Sep 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceEuropean Solid-State Electron Device Conference (ESSDERC 2011)
Period12/09/1116/09/11

Keywords

  • Conf.proc. > 3 pag

Cite this