Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

C Veerappan; J Richardson; R Walker; DU Li; MW Fishburn; D Stoppa; F Borgetti; Y Maruyama; MA Gersbach; RK Henderson; C Bruschini; E Charbon

doi:10.1109/ESSDERC.2011.6044167

Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

C Veerappan, J Richardson, R Walker, DU Li, MW Fishburn, D Stoppa, F Borgetti, Y Maruyama, MA Gersbach, RK Henderson, C Bruschini, E Charbon

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

16 Citations (Scopus)

Original language	English
Title of host publication	Proc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC)
Editors	R Woltjer
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	331-334
Number of pages	4
ISBN (Print)	978-1-4577-0705-6
DOIs	https://doi.org/10.1109/ESSDERC.2011.6044167
Publication status	Published - 2011
Event	European Solid-State Electron Device Conference (ESSDERC 2011) - Piscataway, NJ, USA Duration: 12 Sept 2011 → 16 Sept 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	European Solid-State Electron Device Conference (ESSDERC 2011)
Period	12/09/11 → 16/09/11

Keywords

Conf.proc. > 3 pag

Access to Document

10.1109/ESSDERC.2011.6044167

Cite this

Veerappan, C., Richardson, J., Walker, R., Li, DU., Fishburn, MW., Stoppa, D., Borgetti, F., Maruyama, Y., Gersbach, MA., Henderson, RK., Bruschini, C., & Charbon, E. (2011). Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process. In R. Woltjer (Ed.), Proc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC) (pp. 331-334). IEEE. https://doi.org/10.1109/ESSDERC.2011.6044167

@inproceedings{45573b64114e4fee9512d104e3cca0aa,

title = "Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process",

keywords = "Conf.proc. > 3 pag",

author = "C Veerappan and J Richardson and R Walker and DU Li and MW Fishburn and D Stoppa and F Borgetti and Y Maruyama and MA Gersbach and RK Henderson and C Bruschini and E Charbon",

year = "2011",

doi = "10.1109/ESSDERC.2011.6044167",

language = "English",

isbn = "978-1-4577-0705-6",

publisher = "IEEE",

pages = "331--334",

editor = "R Woltjer",

booktitle = "Proc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC)",

address = "United States",

note = "European Solid-State Electron Device Conference (ESSDERC 2011) ; Conference date: 12-09-2011 Through 16-09-2011",

}

Veerappan, C, Richardson, J, Walker, R, Li, DU, Fishburn, MW, Stoppa, D, Borgetti, F, Maruyama, Y, Gersbach, MA, Henderson, RK, Bruschini, C & Charbon, E 2011, Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process. in R Woltjer (ed.), Proc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC). IEEE, Piscataway, NJ, USA, pp. 331-334, European Solid-State Electron Device Conference (ESSDERC 2011), 12/09/11. https://doi.org/10.1109/ESSDERC.2011.6044167

Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process. / Veerappan, C; Richardson, J; Walker, R et al.
Proc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC). ed. / R Woltjer. Piscataway, NJ, USA: IEEE, 2011. p. 331-334.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

AU - Veerappan, C

AU - Richardson, J

AU - Walker, R

AU - Li, DU

AU - Fishburn, MW

AU - Stoppa, D

AU - Borgetti, F

AU - Maruyama, Y

AU - Gersbach, MA

AU - Henderson, RK

AU - Bruschini, C

AU - Charbon, E

PY - 2011

Y1 - 2011

KW - Conf.proc. > 3 pag

U2 - 10.1109/ESSDERC.2011.6044167

DO - 10.1109/ESSDERC.2011.6044167

M3 - Conference contribution

SN - 978-1-4577-0705-6

SP - 331

EP - 334

BT - Proc. IEEE 41st European Solid-State Electron Device Conference (ESSDERC)

A2 - Woltjer, R

PB - IEEE

CY - Piscataway, NJ, USA

T2 - European Solid-State Electron Device Conference (ESSDERC 2011)

Y2 - 12 September 2011 through 16 September 2011

ER -