Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

N Matsuki; R Ishihara; A Baiano; Y Hiroshima; S Inoue; CIM Beenakker

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

N Matsuki, R Ishihara, A Baiano, Y Hiroshima, S Inoue, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE 2007 Semiconductor advances for future electornics
Editors	s.n.
Place of Publication	s.l.
Publisher	STW
Pages	1-4
Number of pages	4
Publication status	Published - 2007

Publication series

Name
Publisher	STW

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{0ac5f87dad4645fa90a033a8ae9e06ca,

title = "Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",

author = "N Matsuki and R Ishihara and A Baiano and Y Hiroshima and S Inoue and CIM Beenakker",

year = "2007",

language = "Undefined/Unknown",

publisher = "STW",

pages = "1--4",

editor = "s.n.",

booktitle = "SAFE 2007 Semiconductor advances for future electornics",

}

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope. / Matsuki, N; Ishihara, R; Baiano, A et al.
SAFE 2007 Semiconductor advances for future electornics. ed. / s.n. s.l.: STW, 2007. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

AU - Matsuki, N

AU - Ishihara, R

AU - Baiano, A

AU - Hiroshima, Y

AU - Inoue, S

AU - Beenakker, CIM

PY - 2007

Y1 - 2007

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SP - 1

EP - 4

BT - SAFE 2007 Semiconductor advances for future electornics

A2 - s.n., null

PB - STW

CY - s.l.

ER -