Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

N Matsuki, R Ishihara, A Baiano, Y Hiroshima, S Inoue, CIM Beenakker

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publicationMaterials Research Society Symposium Proceedings
Editors s.n
Place of Publications.l
PublisherMRS
Pages94-99
Number of pages6
Publication statusPublished - 2008

Publication series

Name
PublisherMRS

Keywords

  • Conf.proc. > 3 pag

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