Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

N Matsuki; R Ishihara; A Baiano; Y Hiroshima; S Inoue; CIM Beenakker

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

N Matsuki, R Ishihara, A Baiano, Y Hiroshima, S Inoue, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	Materials Research Society Symposium Proceedings
Editors	s.n
Place of Publication	s.l
Publisher	MRS
Pages	94-99
Number of pages	6
Publication status	Published - 2008

Publication series

Name
Publisher	MRS

Bibliographical note

Not reported in 2008

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{f52aa680e38246daa45fd5af36e8993a,

title = "Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy",

keywords = "Conf.proc. > 3 pag",

author = "N Matsuki and R Ishihara and A Baiano and Y Hiroshima and S Inoue and CIM Beenakker",

note = "Not reported in 2008",

year = "2008",

language = "Undefined/Unknown",

publisher = "MRS",

pages = "94--99",

editor = "s.n",

booktitle = "Materials Research Society Symposium Proceedings",

}

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy. / Matsuki, N; Ishihara, R; Baiano, A et al.
Materials Research Society Symposium Proceedings. ed. / s.n. s.l: MRS, 2008. p. 94-99.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

AU - Matsuki, N

AU - Ishihara, R

AU - Baiano, A

AU - Hiroshima, Y

AU - Inoue, S

AU - Beenakker, CIM

N1 - Not reported in 2008

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 94

EP - 99

BT - Materials Research Society Symposium Proceedings

A2 - s.n, null

PB - MRS

CY - s.l

ER -