Original language | Undefined/Unknown |
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Title of host publication | Advanced interconnects and contacts. |
Editors | DC Edelstein, T Kikkawa, M Ozturk, K-N Tu, EJ Weitzman |
Pages | 471-476 |
Number of pages | 6 |
Publication status | Published - 1999 |
Characterization of precipitation in Al-Cu thin films by DSC and X-ray diffraction analysis.
JP Lokker, A Böttger, GCAM Janssen, S Radelaar
Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review