Characterization of precipitation in Al-Cu thin films by DSC and X-ray diffraction analysis.

JP Lokker, A Böttger, GCAM Janssen, S Radelaar

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationAdvanced interconnects and contacts.
    EditorsDC Edelstein, T Kikkawa, M Ozturk, K-N Tu, EJ Weitzman
    Number of pages6
    Publication statusPublished - 1999

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