Characterization of semiconductor interfaces using a modified mixed mode bending apparatus

J. Thijsse, O van der Sluis, JAW van Dommelen, WD van Driel, MGD Geers

Research output: Contribution to journalArticleScientificpeer-review

17 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)401-407
Number of pages7
JournalMicroelectronics Reliability
Volume48
DOIs
Publication statusPublished - 2007

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